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Oleg Lysenko, 2,Avtozavodskaya, Kiev, UKRAINE ismdiadep@gmail.com

Books

  • O. G. Lysenko, S.N. Dub, V.I. Grushko, E.I. Mitskevich, N.V. Novikov "Formation of surface nanostructures by scanning probe microscopy with the diamond tip", In Nanoscale Systems and Nanomaterials: Studies in Ukraine, A.G. Naumovets (Chief Editor), NAS of Ukraine. - K. : Akademperiodyka, 2014, pp. 208-213; ISBN 978-966-360-260-8. (in Russian)
  • O. G. Lysenko, V.I. Grushko, N.V. Novikov "Scanning Probe Microscopy: Fundamentals of the method, Investigation and Modification of a Surface with Diamond Tip", Kiev, Phoenix, 2009, 245 p. (in Russian)

Articles

  • Vladimir Grushko, Iuliia Yamnenko, Sergei Ivakhnenko, Athanasios Mamalis, Valentyn Lysakovskiy, Tetiana Kovalenko, Nikolai Lukianov, Eugene Mitskevich, Oleg Lysenko, Preparation and characterization of conductive diamond for a scanning tunneling microscope tip, Diamond and Related Materials, Volume 130, 2022, 109473, ISSN 0925-9635, https://doi.org/10.1016/j.diamond.2022.109473
  • Chaplynskiy R. Yu., Petrosyan E. E., Mykytiuk T. V., Parkhitko Y. M., Grushko V. I., Lysakovskyi V. V., Mitskevich E. I., Kiriev A. M. and Lysenko O. G., Particle detector with diamond sensitive elements grown in a cubic high pressure apparatus, Sci. innov. 2021 17 (5) p 34-41 https://doi.org/10.15407/scine17.05.034
  • V.Grushko, O.Beliuskina, A.Mamalis, V.Lysakovskiy, E.Mitskevich, A.Kiriev, E.Petrosyan, R.Chaplynskyi, O.Bezshyyko, O.Lysenko, "Energy conversion efficiency in betavoltaic cells based on the diamond Schottky diode with a thin drift layer", Applied Radiation and Isotopes, 2020, 157, 109017.
  • O. G. Lysenko, V. I. Grushko, E. I. Mitskevich, G. D. Ilnitska, Yu. Boyarintsev, Yu. D. Onufriev, V. F. Popov, L. G. Levchuk, N. M. Kazuchits, M. S. Rusetsky, V. V. Lysakovskyi & S. A. Ivakhnenko,"Luminescent and Radiation Characteristics of Monocrystalline Diamond Powders", Journal of Superhard Materials, 2019, 41(1), 17-23.
  • Lysenko O.G., Grushko V.I., Dub S.N., Mitskevich E.I., Novikov N.V., Mamalis A.G. "Manufacturing and Characterization of Nanostructures Using Scanning Tunneling Microscopy with Diamond Tip", Journal of Nano Research, 2016, Vol. 42, pp 14-46.
  • V Grushko, O Lubben, A N Chaika, N Novikov, E Mitskevich, A Chepugov, O Lysenko, B E Murphy, S A Krasnikov and I V Shvets Atomically resolved STM imaging with a diamond tip: simulation and experiment. Nanotechnology 2014, Vol. 25, No.2, pp. 025706-025706.
  • Lysenko O. G., Dub S. N., Grushko V. I., Mitskevich E. I., and Tolmacheva G. N. "Study of phase transformations in silicon by scanning tunneling spectroscopy and nanoindentation" Journal of Superhard Materials, No.6, 2013, pp. 28-35.
  • Chepugov A. P., Chaika A. N., Grushko V. I., Mitskevich E. I., and Lysenko O. G. "Boron-doped diamond single crystals for probes of the high-vacuum tunneling microscopy" Journal of Superhard Materials, No.3, 2013, pp.29-37.
  • Lysenko O. G., Dub S.N, Grushko V.I., Mitskevych E.I., Mamalis A.G. "Combined nanopatterning and characterization of silicon surface using scanning tunelling microscopy with conductive diamond tip". Proceedings of the IEEE Conference on Nanotechnology 2012, pp. 1-4.
  • O. Lysenko, V. Grushko, E. Mitskevich and A. Mamalis Scanning Probe Microscopy with Diamond Tip in Tribo-nanolithography Mater. Res. Soc. Symp. Proc. Vol. 1318 2011, pp. 179-183.
  • V. Grushko, N. Novikov, O. Lysenko, A. Shcherbakov, E. Mitskevich Theoretical study of the behavior of the tunneling current a scanning probe microscope with a diamond tip. Nanosystems, nanomaterials and nanotechnology v.4, No.9, 2011, pp. 735-746. (In Russian).
  • O. Lysenko, A. Mamalis, V. Andruschenko and E. Mitskivich. Surface nanomachining using scanning tunneling microscopy with a diamond tip // Nanotechnology Perceptions. - 2010. - Vol. 6, N 1. - pp. 41-50.
  • M. Tsysar, V. Hrushko, E. Mitskevych, O. Shcherbakov, O. Lysenko Peculiarities of the techniques of the nanostructural material surface studies using semiconductive diamond tip assisted scanning tunneling microscopy Visnyk Lviv Univ. Ser. Physics. 2009. Is. 44. pp. 70-78 (in Ukrainian).
  • O.Lysenko, N.Novikov, V.Grushko, A.Shcherbakov, A.Katrusha, S.Ivakhnenko, V.Tkach, and A. Gontar "Fabrication and Characterization of Single Crystal Semiconductive Diamond Tip for Combined Scanning Tunneling Microscopy" Diamond & Related Materials 17 (2008), pp. 1316-1319.
  • Andruschenko V., Kiriev A., Lendel V., Melnichenko N., Lysenko O., Mitskevych E. Scanning micro-nano modificator. I.Bulletin of Taras Shevchenko National University of Kyiv. Series: Physics & Mathematics, 3, 2008 (in Russian)
  • O.Lysenko, N.Novikov, A.Gontar, V. Grushko, A. Shcherbakov "Combined Scanning Nanoindentation and Tunneling Microscope Technique by Means of Semiconductive Diamond Berkovich Tip" 2007 J. Phys.: Conf. Ser. 61, pp. 740-744
  • O.Lysenko, N.Novikov, V. Grushko, A. Shcherbakov, A.Katrusha, and S.Ivakhnenko "High-density data storage using diamond probe technique" 2008 J. Phys.: Conf. Ser. 100 052032 (4pp).
  • O. G. Lysenko, N. V. Novikov, A. G. Gontar, V. I. Grushko, S. N. Ivanov, and A. Shcherbakov "Semiconductive diamond tip for combined scanning probe microscopy". The Journal of Superhard Materials, No.6 28, 2006, pp. 9-18.
  • V. I. Grushko, O. G. Lysenko "Analytical model for electron tunneling parameters at nanostructural and nanoacoustic studies by means of tunneling microscopy". Nanosystems, nanomaterials and nanotechnology v.2, No.3, 2004 pp. 795-803. (In Ukrainian).
  • O. G. Lysenko, N. V. Novikov, S. L. Shapovalov "Key problems of the tunneling and atomic-force microscopy with diamond tip". Nanosystems, nanomaterials and nanotechnology v.1, No.2, 2004 pp. 427-439. (In Ukrainian).
  • N. V. Novikov, V. I. Grushko, O. G. Lysenko, "Direct measurement of the thin film nanohardness. Proc. Synthesis, sintering and properties of superhard materials. Kiev, 2000, pp. 3-14. (In Russian)
  • V. I. Grushko, "Dependences of the tunneling current change in the scanning tunneling microscope's tip-specimen system". PhD (Physics and Mathematics) Dissertation. 1997. (In Russian).
  • V. I. Grushko, "New method of the numerical evaluation of the STM topograms reliability". Technical diagnostics and non-destructive testing.-No.2.-1996.-pp.17-21. (In Russian).
  • Novikov N. V., Grushko V. I., Androsov I. M., Valuiskii V. Yu., and Drobyazko V. V. "A problem of reliability of scanning tunneling microscopic observations of thin conducting coatings". Superhard Materials, No.2, 1996, pp. 36-42.
  • Novikov N. V., Grushko V. I., Androsov I. M., Valuiskii V. Yu., and Drobyazko V. V. "Substantiated advisability of using semiconductor synthetic diamond stylus in a scanning tunneling microscope". Superhard Materials, No.1, 1996, pp. 1-7.